The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 25, 2014

Filed:

Nov. 12, 2007
Applicant:

Yuko Tawada, Otsu, JP;

Inventor:

Yuko Tawada, Otsu, JP;

Assignee:

Kaneka Corporation, Osaka-shi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 31/042 (2006.01); H01L 31/10 (2006.01); H01L 21/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided in this invention is a low-cost substrate provided with a transparent conductive film for photoelectric conversion device, which can improve performance of the photoelectric conversion device by enhanced light confinement effect achieved with effectively increased surface unevenness of the substrate. A method for manufacturing said substrate and a photoelectric conversion device using said substrate which can show improved performance are also provided. The substrate provided with the transparent conductive film for the photoelectric conversion device comprises a transparent insulating substrate and a transparent electrode layer containing at least zinc oxide deposited on the transparent insulating substrate, wherein the transparent electrode layer is composed of a double layer structure wherein first and second transparent conductive films are deposited in this order from a substrate side. The transparent conductive film has an average film thickness of 10-500 nm, and the second transparent conductive film has an average film thickness of 300-1,500 nm. The average film thickness of the second transparent conductive film is larger than that of the first transparent conductive film, and an average height difference of the unevenness on the surface of the second transparent conductive film is 10-300 nm, which is larger than that of the first transparent conductive film.


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