The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 25, 2014
Filed:
Apr. 04, 2008
Rainer Boehm, Berlin, DE;
Matthias Goldammer, München, DE;
Werner Heinrich, Oberkrämer Ot Bärenklau, DE;
Rainer Boehm, Berlin, DE;
Matthias Goldammer, München, DE;
Werner Heinrich, Oberkrämer Ot Bärenklau, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
A method for the non-destructive material testing of a test object at least solid in some regions by subjecting the test object to ultrasonic waves and capturing the ultrasonic waves reflected within the test object. The method includes the steps, computer-supported dividing of the test object into a prescribed number of volume elements, subjecting the test object to ultrasound on a plurality of surface elements while probing the surface or at least one surface segment of the test object, capturing the sound waves reflected at the volume element while probing the plurality of surface elements on the surface or at least the surface segment of the test object, and in-phase addition of the sound waves reflected at the same volume elements and captured at various surface elements of the surface of the test object. Angle-dependent amplitude distribution is used in the sound field of the test head.