The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 25, 2014

Filed:

Apr. 30, 2009
Applicants:

Kenji Hasegawa, Tokyo, JP;

Tomoyuki Okada, Tokyo, JP;

Nobuhisa Ito, Tokyo, JP;

Inventors:

Kenji Hasegawa, Tokyo, JP;

Tomoyuki Okada, Tokyo, JP;

Nobuhisa Ito, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01L 5/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

A device and method for measuring the thickness of a cloth when the predetermined pressing force is applied to the cloth. A device for measuring a cloth thickness includes a stationary part having a base surface; a movable member having a pressing end to press a cloth against the base surface; a movable member driving mechanism to move the movable member linearly without rotating around itself from an initial position up to an over-pressing position where the pressing end presses the cloth against the base surface with a force exceeding the predetermined pressing force; a load cell for detecting a force with which the pressing end presses the cloth against the base surface; and a pulse coder for detecting the space between the base surface and the pressing end when a force value detected by the load cell reaches the predetermined pressing force.


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