The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 2014
Filed:
Mar. 16, 2011
Hyoung-wook Lee, Seoul, KR;
Min-su Kim, Hwaseong-si, KR;
Chung-hee Kim, Yongin-si, KR;
Jin-soo Park, Yongin-si, KR;
Hyoung-Wook Lee, Seoul, KR;
Min-Su Kim, Hwaseong-si, KR;
Chung-Hee Kim, Yongin-si, KR;
Jin-Soo Park, Yongin-si, KR;
Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;
Abstract
A scan flip-flop circuit includes a pulse generator, a dynamic input unit and a latch output unit. The pulse generator generates a pulse signal which is enabled in synchronization with a rising edge of a clock signal in a normal mode, and is selectively enabled in synchronization with the rising edge of the clock signal in response to a logic level of a scan input signal in a scan mode. The dynamic input unit precharges a first node to a power supply voltage in a first phase of the clock signal, selectively discharges the first node in the normal mode, and discharges the first node in the scan mode. The latch output unit latches an internal signal provided from the first node to provide an output data, and determines whether the output data is toggled based on the clock signal and a previous state of the output data.