The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2014

Filed:

Feb. 02, 2011
Applicants:

Yusuke Tanefusa, Yokohama, JP;

Kenichi Gomi, Yokohama, JP;

Satoshi Yokoo, Yokohama, JP;

Inventors:

Yusuke Tanefusa, Yokohama, JP;

Kenichi Gomi, Yokohama, JP;

Satoshi Yokoo, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus for testing a semiconductor integrated circuit includes a pattern data generating unit configured to generate test pattern data for testing a write operation in a memory of the semiconductor integrated circuit; and a write unit configured to write the test pattern data into a storage area of the semiconductor integrated circuit.


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