The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2014

Filed:

Oct. 07, 2008
Applicants:

Ruth Bergman, Haifa, IL;

Michal Aharon, Haifa, IL;

Tsahi Rosenbaom, Rishon le zion, IL;

Ram Arad, Nez-Ziona, IL;

Carl Staelin, Haifa, IL;

Inventors:

Ruth Bergman, Haifa, IL;

Michal Aharon, Haifa, IL;

Tsahi Rosenbaom, Rishon le zion, IL;

Ram Arad, Nez-Ziona, IL;

Carl Staelin, Haifa, IL;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01); G06F 15/173 (2006.01); G06F 3/00 (2006.01); G06N 5/04 (2006.01); H04L 29/08 (2006.01); G06F 3/0481 (2013.01);
U.S. Cl.
CPC ...
G06N 5/04 (2013.01); H04L 29/08072 (2013.01); G06F 3/0481 (2013.01);
Abstract

Event analysis methods and apparatus in which sequences () of one or more events are identified based on event records () describing the events. Respective distance values () representing distances between ones of the sequences () are determined. A configuration of points in a target metric space is constructed based on the distance values (), where each of the points represents a respective one of the sequences (). A visual representation () of the configuration is presented on a display ().


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