The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 2014
Filed:
May. 20, 2010
Andrea Ivan Marasco, Madrid, ES;
Esteban Martino Gonzalez, Madrid, ES;
Eduardo Vinue Santolalla, Madrid, ES;
Aitor Baldomir Garcia, La Coruna, ES;
Jacobo Diaz Garcia, La Coruna, ES;
Santiago Hernandez Ibanez, La Coruna, ES;
Andrea Ivan Marasco, Madrid, ES;
Esteban Martino Gonzalez, Madrid, ES;
Eduardo Vinue Santolalla, Madrid, ES;
Aitor Baldomir Garcia, La Coruna, ES;
Jacobo Diaz Garcia, La Coruna, ES;
Santiago Hernandez Ibanez, La Coruna, ES;
Airbus Operations, S.L., Madrid, ES;
Abstract
A computer-aided method for carrying out the structural design of a part subjected to damages having significant effects on its structural integrity, such as an aircraft fuselage section subjected to a propeller blade release event, is provided. The method includes: obtaining finite element models that include all the relevant information for an optimization analysis for the un-damaged part and for at least one possible damaged part; defining at least one design variable of the part and at least one design constraint and one load case for the un-damaged part and for the damaged part; providing at least one simulation module for analyzing one or more failure modes of the part; iteratively modifying the design variables of the part for the purpose of optimizing a target function by analyzing simultaneously the un-damaged part and the at least one damaged part using the at least one simulation module.