The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 2014
Filed:
Jun. 11, 2008
Pierre Delajoud, Neuilly sur Seine, FR;
Martin Girard, Paradise Valley, AZ (US);
Pierre Delajoud, Neuilly sur Seine, FR;
Martin Girard, Paradise Valley, AZ (US);
Fluke Corporation, Everett, WA (US);
Abstract
A measurement system uses a plurality of transducers that may differ from each other in at least one respect, such as having different operating principles or being made by different manufacturers. Respective measurement values obtained from the transducers are applied to a processor which provides a measured value based on the measurement values from a plurality of the transducers. The processor also provides information about the calibration drift of each of the transducers based upon a comparison between the measurement value obtained from the transducer to a value obtained from a combination of respective measurement values obtained from a plurality of the transducers. The calibration drift information provides an objective evaluation about the calibration condition of each of the transducers. When a transducer is determined to be outside of its calibration tolerance, a calibration needed alert occurs.