The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2014

Filed:

May. 13, 2011
Applicants:

Joe Haver, Colorado Springs, CO (US);

Takashi Hidai, Palo Alto, CA (US);

Sam Bauer, Colorado Springs, CO (US);

Canning Hsueh, Colorado Springs, CO (US);

Inventors:

Joe Haver, Colorado Springs, CO (US);

Takashi Hidai, Palo Alto, CA (US);

Sam Bauer, Colorado Springs, CO (US);

Canning Hsueh, Colorado Springs, CO (US);

Assignee:

JDS Uniphase Corporation, Milpitas, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

A test device includes a packet input receiver for receiving encapsulated packets from a network; a packet reader for extracting timing information from the encapsulated packets, and for decapsulating encapsulated packets so as to obtain test packets; a FIFO queue for storing the test packets; a packet controller for reading the test packets from the FIFO queue and writing the test packets into a de-jitter buffer in accordance with the timing information, the de-jitter buffer for storing the reordered test packets; and, a packet output generator for providing the test packets to a target device wherein time intervals between the test packets are reproduced using the timing information.


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