The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 2014
Filed:
Mar. 19, 2012
Ian Dewancker, Vancouver, CA;
Arash Abadpour, Toronto, CA;
Eunice Poon, Markham, CA;
Kyel OK, Atlanta, GA (US);
Yury Yakubovich, Markham, CA;
Ian Dewancker, Vancouver, CA;
Arash Abadpour, Toronto, CA;
Eunice Poon, Markham, CA;
Kyel Ok, Atlanta, GA (US);
Yury Yakubovich, Markham, CA;
Seiko Epson Corporation, Tokyo, JP;
Abstract
An automated printout inspection system identifies glyphs in an image by calculating a connectedness score for each foreground pixel, and comparing this score with a specified threshold. The system further generates training images by simulating printouts from an impact printer, including the specifying of specific error types and their magnitudes. The simulated printouts are combined with scan images of real-world printout to train an automated printout inspection system. The inspection results of the automated system are compared with inspection results from human inspectors, and test parameters of the automated system are adjusted so that it renders inspection results within a specified range of the average human inspector.