The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 2014
Filed:
May. 25, 2009
Takemi Hasegawa, Yokohama, JP;
Tetsuya Hayashi, Yokohama, JP;
Haruo Nakaji, Yokohama, JP;
Sumitomo Electric Industries, Ltd., Osaka-shi, Osaka, JP;
Abstract
An optical line monitoring apparatus and optical line monitoring system which can measure a reflectance distribution in an optical line with a high spatial resolution in a short time are provided. An optical line monitoring apparatusA provided in a stationA comprises an OCDR measurement sectionfor carrying out OCDR measurement, an OTDR measurement sectionfor carrying out OTDR measurement, an optical switchfor selectively connecting one of the OCDR measurement sectionand OTDR measurement sectionto the optical coupler, a control section, and a storage device. The control sectionperforms a predetermined arithmetic operation according to an OCDR measurement result acquired by causing the OCDR measurement sectionto carry out the OCDR measurement and an OTDR measurement result acquired by causing the OTDR measurement sectionto carry out the OTDR measurement.