The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2014

Filed:

Oct. 13, 2011
Applicants:

Francisco Imai, Mountain View, CA (US);

John Haikin, Fremont, CA (US);

Inventors:

Francisco Imai, Mountain View, CA (US);

John Haikin, Fremont, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/235 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image capture device includes an imaging assembly having a spectral sensitivity tunable in accordance with a spectral capture mask. A pre-capture captures a sample image of a scene using the imaging assembly tuned by a first spectral capture mask. A second spectral capture mask is constructed by calculations which use image data of the sample image. The second spectral capture mask is constructed to tune the spectral sensitivity of the imaging assembly so as to adjust respective capture parameters for different objects in the scene. The second spectral capture mask is applied to the imaging assembly. An image of the scene is captured with the second spectral capture mask applied to the imaging assembly.


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