The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 2014
Filed:
Feb. 24, 2010
Atsushi Taneno, Kyoto, JP;
Shiro Fujieda, Kyoto, JP;
Atsushi Taneno, Kyoto, JP;
Shiro Fujieda, Kyoto, JP;
Omron Corporation, Kyoto, JP;
Abstract
To easily generate model data having high recognition accuracy and being consistent with measurement conditions and installation environment of each of optical sensors. Basic model representing a range in which a workpiece can be optically recognized is inputted, and pieces of processing of imaging and measuring the workpiece under the same condition as that in an actual measurement and matching feature data of the workpiece obtained from this measurement with the basic model are executed for a plurality of number of cycles. Then, in the basic model, information is set as unnecessary information where the information cannot be associated with the feature data of the workpiece in all of the pieces of matching processing, or where the number of times or ratio the information cannot be associated is more than a predetermined reference value, or where the information cannot be associated with the feature data in any one of the pieces of executed matching processing. Then, the unnecessary information is deleted from the basic model, and information after each deletion is identified as model data to be registered and is registered to the memory.