The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2014

Filed:

May. 18, 2011
Applicants:

Fransciscus G. M. DE Jong, Valkenswaard, NL;

Alexander S. Biewenga, Eindhoven, NL;

Inventors:

Fransciscus G. M. De Jong, Valkenswaard, NL;

Alexander S. Biewenga, Eindhoven, NL;

Assignee:

NXP, B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

Consistent with an example embodiment, there is integrated circuit (IC) die responsive to a reset signal. The IC die includes a detector coupled to a power supply of the die for generating the reset signal in response to the detection of a voltage increase of the power supply. Coupled to the detector, a reset signal output, coupled to the detector, provides the reset signal to an external device.


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De Jong, Fransciscus G. M.. (2014). Testable integrated circuit, system in package and test instruction set (U.S. Patent No. 8653847). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8653847

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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