The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 2014
Filed:
Nov. 15, 2011
Jae-gyun Shim, Suwon-si, KR;
Yun-sung NA, Cheunan-si, KR;
In-gu Jeon, Suwon-si, KR;
Tae-hung Ku, Suwon-si, KR;
Dong-han Kim, Suwon-Si, KR;
Jae-Gyun Shim, Suwon-si, KR;
Yun-Sung Na, Cheunan-si, KR;
In-Gu Jeon, Suwon-si, KR;
Tae-Hung Ku, Suwon-si, KR;
Dong-Han Kim, Suwon-Si, KR;
TechWing Co., Ltd., Hwaseung-si, KR;
Abstract
A test handler is provided, which comprises a test tray, at least one opening unit, and a position changing apparatus. The test tray aligns a plurality of inserts on its side. Each insert loads at least one semiconductor device thereon. The opening unit opens inserts at one part of the one side of the test tray. The position changing apparatus moves at least one opening unit in such a way that the at least one opening units can be located at another part of the one side of the test tray, such that the at least one opening units can open inserts at said another part of the one side of the test tray. The present invention can reduce the number of replaced parts according to change in the semiconductor device size, production cost, and part replacement time.