The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2014

Filed:

Nov. 19, 2010
Applicants:

Vamsy Chodavarapu, Montreal, CA;

Mark Trifiro, Montreal, CA;

Inventors:

Vamsy Chodavarapu, Montreal, CA;

Mark Trifiro, Montreal, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/28 (2006.01); G01R 27/02 (2006.01);
U.S. Cl.
CPC ...
G01R 27/02 (2013.01);
Abstract

Advances in a variety of fields such as micromachined silicon in conjunction with MEMS and other devices and attaching biosensors to electrode structures have allowed discrete or continuous monitoring devices to be implemented for biological systems, chemical processes, environmental monitoring etc. However, such devices are typically analysed within controlled laboratory environments due to bulky and large electrochemical impedance measurement systems. In many situations deployment in field, clinic, point-of-care, or consumer scenarios would be beneficial. Accordingly it an intention of the invention to provide a measurement system which offers potential for low cost implementations via multiple technologies to address the different cost targets of these applications as well as number of measurement cells within each. Additionally embodiments of the invention are self-calibrating and self-referencing allowing their use in such scenarios absent highly trained technicians.


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