The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 2014
Filed:
Dec. 02, 2008
Lonnie C. Maxey, Powell, TN (US);
James E. Parks, Ii, Knoxvile, TN (US);
Samuel A. Lewis, Sr., Powell, TN (US);
William P Partridge, Jr., Oak Ridge, TN (US);
Lonnie C. Maxey, Powell, TN (US);
James E. Parks, II, Knoxvile, TN (US);
Samuel A. Lewis, Sr., Powell, TN (US);
William P Partridge, Jr., Oak Ridge, TN (US);
UT-Battelle, LLC, Oak Ridge, TN (US);
Abstract
Methods and apparatuses for evaluating a material are described. Embodiments typically involve use of an impedance measurement sensor to measure the impedance of a sample of the material under at least two different states of illumination. The states of illumination may include (a) substantially no optical stimulation, (b) substantial optical stimulation, (c) optical stimulation at a first wavelength of light, (d) optical stimulation at a second wavelength of light, (e) a first level of light intensity, and (f) a second level of light intensity. Typically a difference in impedance between the impedance of the sample at the two states of illumination is measured to determine a characteristic of the material.