The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 2014
Filed:
May. 18, 2011
Satoru Sawada, Kodama-gun, JP;
Masato Inoue, Kumagaya, JP;
Noriaki Oguri, Zama, JP;
Shinichi Takeda, Honjo, JP;
Masayoshi Akiyama, Yokohama, JP;
Taiki Takei, Kumagaya, JP;
Satoru Sawada, Kodama-gun, JP;
Masato Inoue, Kumagaya, JP;
Noriaki Oguri, Zama, JP;
Shinichi Takeda, Honjo, JP;
Masayoshi Akiyama, Yokohama, JP;
Taiki Takei, Kumagaya, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
A radiation detection apparatus comprising semiconductor substrates each having a first surface on which a photoelectric conversion portion is formed and a second surface opposite to the first surface; a scintillator layer, placed over the first surfaces of the semiconductor substrates, for converting radiation into light; and an elastic member, placed between a base and the second surfaces, for supporting the second surfaces of the semiconductor substrates such that the first surfaces of the semiconductor substrates are flush with each other is provided. In measurement of the elastic member as a single body, an amount of stretch of a cubic specimen in a direction parallel to the first surface when being compressed in a direction perpendicular to the first surface is smaller than an amount of stretch of the specimen in the direction perpendicular to the first surface when being compressed in the direction parallel to the first surface.