The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2014

Filed:

Dec. 31, 2012
Applicant:

Agilent Technologies, Inc., Loveland, CO (US);

Inventors:

Alexander Mordehai, Santa Clara, CA (US);

Edward Darland, Santa Clara, CA (US);

Assignee:

Agilent Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/40 (2006.01);
U.S. Cl.
CPC ...
H01J 49/40 (2013.01);
Abstract

A method is provided increasing the useful dynamic range of an ion mobility spectrometry (IMS) or an IMS-mass spectrometry (IMS-MS) device. The method includes accumulating a first sample of ions over a first time interval; providing the first sample of ions to an ion detector to provide a first frame, accumulating a second sample of ions over a second time interval, where the second time interval is different than the first time interval, and providing the second sample of ions to the ion detector to provide a second frame. First data points of the first frame are selectively combined with second data points of the second frame to provide an accumulation frame of the first and second samples of ions.


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