The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2014

Filed:

Jun. 14, 2012
Applicants:

Junpei Maruyama, Yamanashi, JP;

Minoru Kobayashi, Yamanashi, JP;

Inventors:

Junpei Maruyama, Yamanashi, JP;

Minoru Kobayashi, Yamanashi, JP;

Assignee:

Fanuc Corporation, Yamanashi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B29C 45/77 (2006.01);
U.S. Cl.
CPC ...
Abstract

A reference physical quantity and a current physical quantity are successively compared with each other in association with an elapsed time during which a moving part operates or an operating position of the moving part, and a deviation of the physical quantity is determined. An average of absolute values of the determined deviations of the physical quantities is calculated, and a threshold corresponding to the elapsed time during which the moving part operates or the operating position of the moving part is calculated such that the threshold increases as the calculated absolute value increases. Abnormality is detected if the calculated threshold is exceeded by the determined deviation of the physical quantity.


Find Patent Forward Citations

Maruyama, Junpei. (2014). Abnormality detection apparatus of an injection molding machine (U.S. Patent No. 8651846). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8651846

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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