The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2014

Filed:

Feb. 03, 2012
Applicants:

Matthew D. Mullin, Memphis, NY (US);

John A. Lane, Weedsport, NY (US);

Scott A. Martin, Warners, NY (US);

Craig M. Meyerson, Syracuse, NY (US);

David E. Quinn, Auburn, NY (US);

Ray Douglas Stone, Camillus, NY (US);

Inventors:

Matthew D. Mullin, Memphis, NY (US);

John A. Lane, Weedsport, NY (US);

Scott A. Martin, Warners, NY (US);

Craig M. Meyerson, Syracuse, NY (US);

David E. Quinn, Auburn, NY (US);

Ray Douglas Stone, Camillus, NY (US);

Assignee:

Welch Allyn, Inc., Skaneateles Falls, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01K 1/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A temperature measurement system includes a temperature probe including a temperature sensor. The system also includes a reader, and a controller in communication with the temperature sensor and the reader. The system further includes a container housing a plurality of probe covers associated with the temperature probe. The container includes an information feature providing information related to the plurality of probe covers. The reader is configured to read the information and direct a signal to the controller indicative of the information.


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