The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2014

Filed:

Nov. 16, 2009
Applicants:

Marc Grieu, Ivry sur Seine, FR;

Gregor Massiot, Toulouse, FR;

Inventors:

Marc Grieu, Ivry sur Seine, FR;

Gregor Massiot, Toulouse, FR;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/32 (2006.01);
U.S. Cl.
CPC ...
Abstract

To measure the fatigue ageing of an electronic component in an electronic assembly subjected to mechanical excitations, a dynamic correspondence is established between kinematic measurements at certain points and mechanical stresses experienced at points that are critical as regard to the reliability of the electronic assembly. The critical points may be different from the measurement points. This correspondence is integrated into a monitoring device as a functionality that calculates the mechanical stresses, thereby providing an indicator of the cumulative fatigue damage. The invention is such that the monitoring device can be incorporated into the electronic assembly, preferably, the monitoring device is autonomous both as regard to processing the measurements and calculating the damage.


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