The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2014

Filed:

Feb. 23, 2010
Applicants:

Peter Speckbacher, Kirchweidach, DE;

Josef Weidmann, Altenmarkt, DE;

Wolfgang Holzapfel, Obing, DE;

Inventors:

Peter Speckbacher, Kirchweidach, DE;

Josef Weidmann, Altenmarkt, DE;

Wolfgang Holzapfel, Obing, DE;

Assignee:

Johannes Heidenhain GmbH, Traunreut, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 5/347 (2006.01); G01D 5/26 (2006.01); G01B 11/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

An assembly including a substrate and a scale held on the substrate, wherein the scale has a measuring graduation, and the scale is held on the substrate by pneumatic suction. The scale is braced on the substrate via two-dimensionally distributed, spaced-apart supports, which are disposed facing a measurement area defined by the measuring graduation and wherein adjacent ones of the supports are spaced apart from one another at a mutual period that is less than a thickness of the scale. In addition, the supports have a structure such that a connection by optical contact bonding between the supports and the scale and/or between the supports and the substrate is prevented at least in the measurement area. A space between the scale and the substrate is sealed off from surroundings by a sealing structure.


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