The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 11, 2014

Filed:

Mar. 11, 2009
Applicants:

Simon Litsyn, Giv'at Shmuel, IL;

Idan Alrod, Herzliya, IL;

Eran Sharon, Rishon Lezion, IL;

Mark Murin, Kfar Saba, IL;

Menahem Lasser, Kohav Yair, IL;

Inventors:

Simon Litsyn, Giv'at Shmuel, IL;

Idan Alrod, Herzliya, IL;

Eran Sharon, Rishon Lezion, IL;

Mark Murin, Kfar Saba, IL;

Menahem Lasser, Kohav Yair, IL;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); H03M 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Data that are stored in cells of a multi-bit-per cell memory, according to a systematic or non-systematic ECC, are read and corrected (systematic ECC) or recovered (non-systematic ECC) in accordance with estimated probabilities that one or more of the read bits are erroneous. In one method of the present invention, the estimates are a priori. In another method of the present invention, the estimates are based only on aspects of the read bits that include significances or bit pages of the read bits. In a third method of the present invention, the estimates are based only on values of the read bits. Not all the estimates are equal.


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