The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 11, 2014

Filed:

Feb. 28, 2013
Applicant:

SK Hynix Memory Solutions Inc., San Jose, CA (US);

Inventors:

Kin Man Ng, Cupertino, CA (US);

Lingqi Zeng, Turlock, CA (US);

Yu Kou, San Jose, CA (US);

Kwok W. Yeung, Milpitas, CA (US);

Assignee:

SK hynix memory solutions inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A cost function is obtained. For each of a plurality of groups of nodes, the cost function is evaluated by obtaining, for a given group of nodes, one or more reliability values associated with the given group of nodes; the one or more reliability values include sign and magnitude. For a given group of nodes, a reliability value with a smallest magnitude is selected where the evaluated cost function for the given group of nodes is set to the smallest magnitude. One of the plurality of groups of nodes is selected based at least in part on the evaluated cost functions. Error correction decoding related processing is performed on the selected group of nodes.


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