The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 2014
Filed:
Nov. 24, 2009
Michinari Momma, Tokyo, JP;
Satoshi Morinaga, Tokyo, JP;
Daisuke Komura, Tokyo, JP;
NEC Corporation, Tokyo, JP;
Abstract
An active metric learning device includes a metric application data analysis unit, a metric optimization unit, and an attribute clustering unit. The metric application data analysis unit is formed with a metric applying module for calculating the distance between data to be analyzed, a data analyzing module for analyzing the data using a predetermined function and the distances between the data to be analyzed and outputting the result of the data analysis, and an analysis result storage unit for storing the result of the data analysis. The metric optimization unit is formed with a feedback converting module for creating side information according to the command of feedback from the user and a metric learning module for generating a metric matrix optimized under a predetermined condition using the created side information. The attribute clustering unit clusters the metric matrix optimized by the metric optimization unit and structuralizes the attributes.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile