The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 2014
Filed:
Sep. 25, 2009
Applicant:
Chao Yuan, Plainsboro, NJ (US);
Inventor:
Chao Yuan, Plainsboro, NJ (US);
Assignee:
Siemens Corporation, Iselin, NJ (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/18 (2006.01);
U.S. Cl.
CPC ...
Abstract
In a machine condition monitoring technique, related sensors are grouped together in clusters to improve the performance of state estimation models. To form the clusters, the entire set of sensors is first analyzed using a Gaussian process regression (GPR) to make a prediction of each sensor from the others in the set. A dependency analysis of the GPR then uses thresholds to determine which sensors are related. Related sensors are then placed together in clusters. State estimation models utilizing the clusters of sensors may then be trained.