The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 2014
Filed:
Nov. 12, 2009
Kiyoshi Kobayashi, Kameoka, JP;
Kazuya Aoki, Kawasaki, JP;
Kiyoshi Kobayashi, Kameoka, JP;
Kazuya Aoki, Kawasaki, JP;
Kyoto University, Kyoto, JP;
Pasco Corporation, Tokyo, JP;
Abstract
When a manager uses an input device to input the inspected states of the degrees of soundness of a plurality of objects, a data receiving unit receives them as inspection data. A deterioration characteristic calculating unit calculates the average value of the deterioration characteristics of the objects based on data related to the degrees of soundness of the plurality of objects that is received by the data receiving unit. A heterogeneous parameter calculating unit calculates a heterogeneous parameter for each heterogeneous factor that cannot be observed or is difficult to observe, and causes a variation in the deterioration characteristics. A benchmarking unit evaluates the influence of the heterogeneous factors on the deterioration characteristics based on the heterogeneous parameters, and an output unit outputs the evaluation result.