The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 2014
Filed:
Oct. 30, 2009
Pingsha Dong, Columbus, OH (US);
Zhigang Wei, Ann Arbor, MI (US);
Jeong K. Hong, Dublin, OH (US);
Battelle Memorial Institute, Columbus, OH (US);
Abstract
A method is provided for performing fatigue evaluation of a fatigue prone location of a tangible structure by converting multi-axial loading data of the fatigue prone location of the tangible structure to a set of equivalent constant amplitude loading data for the tangible structure. According to the method, a multi-axial load locus representing the tangible structure is generated. Time-dependent interior turning points R and any corresponding projected turning point R* art identified along the loading path from the point of origin P to the point of termination Q. Half cycles in the loading path are counted by referring to the interior and projected turning points R, R* along the loading path and to the point of origin P and the point of termination Q on the load locus. A stress range Δσ, loading path length L, and virtual path length for each of the counted half cycles are determined. Additional stress ranges Δσ, loading path lengths L, and virtual path lengths are determined recursively for half cycles counted in additional loading paths on the load locus. A system is also provided for performing fatigue evaluation. Methods are also provided for counting and displaying the number of load cycles represented in multi-axial loading data of a fatigue prone location of the tangible structure. Additional embodiments are disclosed and claimed.