The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 11, 2014

Filed:

Oct. 16, 2009
Applicant:

Xavier Nouvelle, Les Matelles, FR;

Inventor:

Xavier Nouvelle, Les Matelles, FR;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01);
U.S. Cl.
CPC ...
Abstract

The process of determining similarities of signals resulting from a sample analysis step using the same type of measuring device, characterized by the fact that it comprises a step of determining a value for each parameter of an uncertainty model related to said signals by processing homologous characteristic elements in at least two signals derived from the analysis of similar samples, and a step of determining a measurement of similarity between signals based on each parameter value of the said uncertainty model and of homologous characteristic elements in the different signals whose similarity is being measured. In some embodiments, during the value determination step, a mathematical uncertainty model is optimized so that it corresponds to the theoretically expected differences between the homologous characteristic elements in the various signals from similar samples.


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Nouvelle, Xavier. (2014). Process and apparatus for processing signals (U.S. Patent No. 8649984). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8649984

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