The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 2014
Filed:
Apr. 22, 2011
Sandeep Gulati, La Canada Flintridge, CA (US);
Sandeep Gulati, La Canada Flintridge, CA (US);
ViaLogy LLC, Pasadena, CA (US);
Abstract
Application of nonlinear resonance interferometry is introduced as a new geophysical approach to improve predictability in characterization of subsurface microseismic event analysis and propagation of fracture. In contrast to reflection methods that remove random information noise, nonlinear resonance interferometry exploits the full microseismic acquisition spectrum. In some examples, systems and techniques implement novel computational interactions between acquired microseismic wavefield attributes and a nonlinear system in software to amplify distortions in microseismic noise and exploits injection of synthetic noise, in software format, to fracture events.