The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 11, 2014

Filed:

Feb. 14, 2013
Applicant:

Broadcom Corporation, Irvine, CA (US);

Inventors:

Francis Swarts, San Diego, CA (US);

Mark Kent, Vista, CA (US);

Assignee:

Broadcom Corporation, Irvine, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 1/16 (2006.01);
U.S. Cl.
CPC ...
Abstract

Aspects of a method and system for reducing the complexity of multi-frequency hypothesis testing using an iterative approach may include estimating a frequency offset of a received signal via a plurality of iterative frequency offset hypotheses tests. The iterative frequency offset hypotheses may be adjusted for each iteration. A correlation may be done between a primary synchronization signal (PSS), and one or more frequency offset versions of a received signal to control the adjustment of the iterative frequency offset hypotheses. A frequency of the received local oscillator signal may be adjusted based on the estimated frequency offset. One or more frequency offset version of the received signal may be generated via one or more multiplication, and the multiplication may be achieved via a multiplication signal corresponding to one or more frequency offsets. The frequency offset of the received signal may be estimated via the correlation.


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