The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 11, 2014

Filed:

Jan. 25, 2011
Applicants:

Majeed M. Hayat, Albuquerque, NM (US);

Sanjay Krishna, Albuquerque, NM (US);

Biliana Stefanova Paskaleva, Albuquerque, NM (US);

Inventors:

Majeed M. Hayat, Albuquerque, NM (US);

Sanjay Krishna, Albuquerque, NM (US);

Biliana Stefanova Paskaleva, Albuquerque, NM (US);

Assignee:

STC.UNM, Albuquerque, NM (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
Abstract

Apparatus, systems, and methods integrating spectral information with spatial feature extraction of image data, providing simultaneous spatial and spectral feature selection of the image data, can be used in a variety of applications. In various embodiments, an edge signature for the edge between two materials can be defined using ratios of identified spectral bands, where the edge signature can be combined with a spatial mask to obtain a joint spatio-spectral mask. Additional apparatus, systems, and methods are disclosed.


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