The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 2014
Filed:
Jul. 30, 2009
Applicant:
Peter Majewicz, Boise, ID (US);
Inventor:
Peter Majewicz, Boise, ID (US);
Assignee:
Hewlett-Packard Development Company, L.P., Houston, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 1/46 (2006.01); H04N 1/04 (2006.01); G06F 3/12 (2006.01); G03F 3/08 (2006.01); H04N 1/40 (2006.01); G06T 5/00 (2006.01); H04N 1/60 (2006.01); G06K 15/00 (2006.01); G09G 3/10 (2006.01); H04N 3/14 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
Systems and methods systems and methods for calibrating field uniformity are disclosed. An exemplary method includes scanning the imaging area including a first media to obtain optical data for a specular reflectance map. The method also includes scanning the imaging area including a second media to obtain optical data for a diffuse reflective map. The method also includes storing the specular reflectance map and the diffuse reflective map for adjusting actual pixel values during an imaging operation.