The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8648605 B1

PDF
Full Text
Expired
Date of Patent:
Feb. 11, 2014

Filed:

Sep. 26, 2008
Applicants:

Hidehiro Nakamura, Tsukuba, JP;

Tooru Nakamura, Ibaraki, JP;

Yutaka Hayashi, Ibaraki, JP;

Yuji Kawanishi, Ibaraki, JP;

Inventors:

Hidehiro Nakamura, Tsukuba, JP;

Tooru Nakamura, Ibaraki, JP;

Yutaka Hayashi, Ibaraki, JP;

Yuji Kawanishi, Ibaraki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/62 (2006.01);
U.S. Cl.
CPC ...
Abstract

This invention provides a sensor having such a structure that the area in which a sensor electrode comes into contact with a liquid, a mist or a gas containing an analyte has been previously specified. The sensor comprises at least an electroconductive first electrode, an electroconductive second electrode, electroconductive first and second wirings connected to the first and second electrodes, and an insulating part for insulating the first and second wirings from each other and from a liquid, a mist or a gas containing the analyte. The insulating part is formed of an organic material. In the first and second electrodes, at least the surface, which comes into contact with a liquid, a mist or a gas containing the analyte, is formed of a material which is insoluble in a liquid or a mist containing the analyte, or is not attacked by a gas containing the analyte.


Find Patent Forward Citations

Nakamura, Hidehiro. (2014). Sensor, sensor system, portable sensor system, method of analyzing metal ions, mounting substrate, method of analyzing plating preventing chemical species, method of analyzing produced compound, and method of analyzing monovalent copper chemical species (U.S. Patent No. 8648605). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8648605

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