The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 2014
Filed:
Jan. 27, 2011
Jan Ole Blumhagen, Nuremberg, DE;
Matthias Fenchel, Erlangen, DE;
Ralf Ladebeck, Erlangen, DE (US);
Siemens Aktiengesellschaft, Munich, DE;
Abstract
A method is disclosed for determining a location of a subarea of an area under examination in a magnetic resonance system. The subarea is arranged at the edge of a field-of-view of the magnetic resonance system. In at least one embodiment of the method, at least one slice position is determined for an MR image in which the Bfield at the edge of the MR image satisfies a homogeneity value. For the slice position determined an MR image is acquired which contains the subarea at the edge of the field-of-view and the location of the subarea of the object under examination is determined through the location of the subarea in the MR image.