The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 11, 2014

Filed:

Oct. 17, 2007
Applicants:

Kimberly A. Prather, Encinitas, CA (US);

Joseph E. Mayer, Encinitas, CA (US);

Marc Gonin, Thun, CH;

Katrin Fuhrer, Thun, CH;

Inventors:

Kimberly A. Prather, Encinitas, CA (US);

Joseph E. Mayer, Encinitas, CA (US);

Marc Gonin, Thun, CH;

Katrin Fuhrer, Thun, CH;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/40 (2006.01); H01J 49/00 (2006.01);
U.S. Cl.
CPC ...
H01J 49/40 (2013.01); H01J 49/0095 (2013.01);
Abstract

Among other things, methods, systems, apparatus for performing on-the-fly apportionment are described. In particular, a mass spectrometry apparatus includes an ionization laser to produce a deionization laser beam. The apparatus also includes a particle beam path that receives aerosol particles and intersects the ionization laser beam at a location where aerosol particles are desorbed and ionized by the laser beam. The apparatus also includes an ion extractor located at or near the ionization location to separate positive ions and negative ions desorbed from the aerosol particles and to direct the positive ions along a first direction of an ion path and the negative ions along a second, opposite direction of the ion path. The apparatus also includes a first reflectron located at a first side of the ion extractor, on the ion path, to reflect the positive ions along a first reflection path that deviates from the ion path.


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