The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 2014
Filed:
Feb. 22, 2011
Kouki Tanigakiuchi, Kamisu, JP;
Mikio Sekiguchi, Saitama-Ken, JP;
Hiroki Hotta, Saitama, JP;
Shizuo Shimano, Ageo, JP;
Akinori Morikawa, Kamisu, JP;
Kazumi Yamamoto, Kamakura, JP;
Nozomu Nakanishi, Yokohama, JP;
Nobuto Minowa, Yokohama, JP;
Takashi Watanabe, Yokohama, JP;
Kouki Tanigakiuchi, Kamisu, JP;
Mikio Sekiguchi, Saitama-Ken, JP;
Hiroki Hotta, Saitama, JP;
Shizuo Shimano, Ageo, JP;
Akinori Morikawa, Kamisu, JP;
Kazumi Yamamoto, Kamakura, JP;
Nozomu Nakanishi, Yokohama, JP;
Nobuto Minowa, Yokohama, JP;
Takashi Watanabe, Yokohama, JP;
Nippon Kayaku Co., Ltd., Tokyo, JP;
Meiji Seika Pharma Co., Ltd., Tokyo-To, JP;
Abstract
An objective of the present invention is to provide a crystal of 2-ethyl-3,7-dimethyl-6-(4-(trifluoromethoxy)phenoxy)quinoline-4-yl methyl carbonate having stable physicochemical properties. The objective is attained by a crystal of 2-ethyl-3,7-dimethyl-6-(4-(trifluoromethoxy)phenoxy)quinoline-4-yl methyl carbonate that exhibits a diffraction peak pattern shown in FIG.as determined by powder X-ray diffractometry.