The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 2014
Filed:
Nov. 18, 2009
David James Harra, Scotts Valley, CA (US);
Peter F. Mastin, Verdi, NV (US);
Mark Norman Iverson, Reno, NV (US);
Rick Eugene Sanner, Sun Valley, NV (US);
Martin Albert Hutchinson, Santa Clara, CA (US);
David James Harra, Scotts Valley, CA (US);
Peter F. Mastin, Verdi, NV (US);
Mark Norman Iverson, Reno, NV (US);
Rick Eugene Sanner, Sun Valley, NV (US);
Martin Albert Hutchinson, Santa Clara, CA (US);
RF Science & Technology Inc, Reno, NV (US);
Abstract
Systems and methods for non-invasively scanning and analyzing one or more characteristics of a sample utilizing electromagnetic radiation are described. More particularly, the systems and methods utilize an electromagnetic radiation source connected to a transmitter and an analyzer connected to a receiver. A sample to be analyzed is placed between the transmitter and receiver in a variety of different manners and a frequency sweep of electromagnetic radiation is transmitted through the sample to create a series of spectral data sets that are used to create one or more composite spectrograms, which are then analyzed to determine one or more characteristics of the sample. A magnetic field can alternatively be applied around the transmitter, receiver and sample to enhance some characteristic analysis applications. Samples include inert and living items, and the characteristics include a wide variety of different applications.