The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2014

Filed:

Apr. 16, 2008
Applicants:

Chung Heong Gooi, Woodinville, WA (US);

Xinyu Liu, Beijing, CN;

Fabio Pintos, Redmond, WA (US);

Xin LI, Redmond, WA (US);

Inventors:

Chung Heong Gooi, Woodinville, WA (US);

Xinyu Liu, Beijing, CN;

Fabio Pintos, Redmond, WA (US);

Xin Li, Redmond, WA (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

A scalable system and method is described that automatically identifies one or more generic tests for testing a GUI. A generic test case is written once instead of writing test cases for every single page or assembly. Each page has a corresponding page type. Each generic test is mapped to one or more testing rules, where the testing rules each have a rule type. An automated system is provided to scan target directories for all relevant pages related to a software product, identify a page type for each page, identify the appropriate generic test cases to be applied to each page, execute the generic test cases, and provide an output to indicate the results of the tests on the various pages. The generic tests for the GUIs can thus be automatically applied to identify and eliminate a certain class of bugs matching the behavior of the generic test case.


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