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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8645904 B1

PDFFull Text
Date of Patent:
Feb. 04, 2014

Filed:

Oct. 26, 2009

Cross repository impact analysis using topic maps

Applicants:

Peter Alan Coldicott, Austin, TX (US);

Eoin Lane, Littleton, MA (US);

Magda Mahmoud Mourad, Yorktown Heights, NY (US);

Franciscus Jacobus Van Ham, Cambridge, MA (US);

Inventors:

Peter Alan Coldicott, Austin, TX (US);

Eoin Lane, Littleton, MA (US);

Magda Mahmoud Mourad, Yorktown Heights, NY (US);

Franciscus Jacobus van Ham, Cambridge, MA (US);

Assignee:

International Business Machines Corporation, Armonk, NY (US);

Attorneys:

Patents on Demand P.A.

Brian K. Buchheit

Scott M. Garrett

Primary Examiner:

Gurkanwaljit Singh

Int. Cl.
CPC ...
G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus for automatically analyzing the impact of changing a business requirement on an IT infrastructure of an enterprise. A request is received to perform an analysis of an impact on the enterprise by changing a particular instance of the business requirement. A model repository is queried to determine which IT assets of the enterprise are impacted by changing the particular instance of the business requirement. An impact relevant subset of a topic map is received from the model repository representing the impact on the enterprise by changing the particular instance of the business requirement that includes the particular instance requirement as a root node and only those specific assets impacted by changing the particular instance requirement as connected nodes. Then, the impact relevant subset of the topic map representing the impact on the enterprise by changing the particular instance of the business requirement is outputted on an output device.

Find Patent Forward Citations

Coldicott, Peter. (2014). Cross repository impact analysis using topic maps (U.S. Patent No. 8645904). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8645904

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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