The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2014

Filed:

Dec. 30, 2011
Applicants:

Jeffrey T. Rahn, Sunnyvale, CA (US);

Han Henry Sun, Ottawa, CA;

Stanley H. Blakey, Kanata, CA;

Inventors:

Jeffrey T. Rahn, Sunnyvale, CA (US);

Han Henry Sun, Ottawa, CA;

Stanley H. Blakey, Kanata, CA;

Assignee:

Infinera Corporation, Sunnyvale, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01); H03M 13/03 (2006.01); G06F 7/02 (2006.01); H04B 17/00 (2006.01); H04N 7/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system receives a first word on which to perform error correction; identifies combinations in which encoded bits, within the first word, can be inverted; generates candidate words based on the first word and the combinations; decodes the candidate words; determines distances between the decoded words and the first word; selects, as a second word, one of the decoded words associated with a shortest distance; compares the second word to the first word to identify errors within the first word; generates a value to cause a reliability level of the first word to increase when a quantity of the errors is less than a threshold; generates another value to cause a reliability level of the first word to decrease when the quantity of the errors is not less than the threshold; and outputs a third word based on the first word, and the value or the other value.


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