The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2014

Filed:

Apr. 10, 2012
Applicants:

Waldemar Jackiewicz, Halinow, PL;

Vito Losacco, Ardea, IT;

Andrzej Nazaruk, Warsaw, PL;

Mahesh Viswanathan, Yorktown Heights, NY (US);

Maciej Wielgus, Gliwice, PL;

Inventors:

Waldemar Jackiewicz, Halinow, PL;

Vito Losacco, Ardea, IT;

Andrzej Nazaruk, Warsaw, PL;

Mahesh Viswanathan, Yorktown Heights, NY (US);

Maciej Wielgus, Gliwice, PL;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

An approach for replicating data is provided. A job that modifies data objects in a first system to generate a first set of changed data objects is determined to be a candidate for a job replication. Based on the job being a candidate for job replication, attributes of the job are retrieved, the retrieved attributes are sent to a second system, and an execution of the job by the second system is initiated as part of the job replication. The execution of the job causes data objects included in the second system to be modified to generate a second set of changed data objects as a replication of the first set of changed data objects.


Find Patent Forward Citations

Loading…