The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2014

Filed:

May. 27, 2005
Applicants:

Benjamin LI, McLean, VA (US);

Xinyi Wang, Herndon, VA (US);

Xiaonan Han, Fairfax, VA (US);

Daniel Kerzner, Arlington, VA (US);

Hanijanto Soewandi, Germantown, MD (US);

Inventors:

Benjamin Li, McLean, VA (US);

Xinyi Wang, Herndon, VA (US);

Xiaonan Han, Fairfax, VA (US);

Daniel Kerzner, Arlington, VA (US);

Hanijanto Soewandi, Germantown, MD (US);

Assignee:

Microstrategy, Inc., McLean, VA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01); G06F 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method for indexing non-uniquely indexed entries in a report generated with a business intelligence system, such as, for example, an on-line analytical processing (OLAP) system. A dummy index is added to each index element returned in the report. Non-unique index elements receive different dummy indices to distinguish otherwise identical row elements. The dummy index is added to a base template and optionally also to a view template of a report generator of the OLAP system.


Find Patent Forward Citations

Loading…