The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2014
Filed:
Nov. 01, 2011
Bibudh Lahiri, Jersey City, NJ (US);
Fabian Moerchen, Rocky Hill, NJ (US);
Ioannis Akrotirianakis, Plainsboro, NJ (US);
Bibudh Lahiri, Jersey City, NJ (US);
Fabian Moerchen, Rocky Hill, NJ (US);
Ioannis Akrotirianakis, Plainsboro, NJ (US);
Siemens Aktiengesellschaft, Munich, DE;
Abstract
Systems and methods for determining critical thresholds on a number of events (k) and a window length (t) for properly defining a burst of events in a data stream. A new coverage metric Cis defined and used in the determination, where the coverage metric Cis defined for a particular pair (k,t) as a fraction, with the numerator defined a number of events that occur within some (k,t)-bursty window and the denominator defined as the total number of events (n) that occurred along the entire time span being analyzed. Coverage metric Cis monotonic non-increasing in k and monotonic non-decreasing in t, allowing for a divide-and-conquer search strategy to be used to find the critical threshold pairs (k*, t*).