The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2014

Filed:

Oct. 26, 2010
Applicants:

Juan E. Sandoval, St. Petersburg, FL (US);

Nicholas I. Sapankevych, Clearwater, FL (US);

Sara R. Lemley, Clearwater, FL (US);

Inventors:

Juan E. Sandoval, St. Petersburg, FL (US);

Nicholas I. Sapankevych, Clearwater, FL (US);

Sara R. Lemley, Clearwater, FL (US);

Assignee:

Raytheon Company, Waltham, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01); G06N 5/02 (2006.01); G05B 19/18 (2006.01); G05B 15/00 (2006.01); G05B 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

According to certain embodiments, paths are identified from path data. One or more sensors are assigned to each path. The following are performed: at least one sensor is moved to a path intersection and excess sensors are removed. An excess sensor is a sensor that is not required to satisfy the desired number of sensors of one or more paths. According to certain embodiments, a combined array comprising combined entries is accessed. Each combined entry represents a location and has a value indicating a number of paths at the location. The following are performed to yield a sensor arrangement: a maximum value of the combined array is identified, a sensor is assigned to a location associated with the maximum value, and the paths are removed from the combined array. A result associated with the sensor arrangement is reported.


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