The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2014
Filed:
Mar. 26, 2008
Applicants:
Franz Josef Och, Palo Alto, CA (US);
Michael E. Jahr, San Francisco, CA (US);
Ignacio E. Thayer, San Francisco, CA (US);
Inventors:
Franz Josef Och, Palo Alto, CA (US);
Michael E. Jahr, San Francisco, CA (US);
Ignacio E. Thayer, San Francisco, CA (US);
Assignee:
Google Inc., Mountain View, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/28 (2006.01);
U.S. Cl.
CPC ...
Abstract
Systems, methods, and apparatuses including computer program products for machine learning. A method is provided that includes determining model parameters for a plurality of feature functions for a linear machine learning model, ranking the plurality of feature functions according to a quality criterion, and selecting, using the ranking, a group of feature functions from the plurality of feature functions to update with the determined model parameters.