The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2014
Filed:
Aug. 06, 2012
Joseph Curtis Diepenbrock, Raleigh, NC (US);
Roland Frech, Ostfildern, DE;
Joseph Curtis Diepenbrock, Raleigh, NC (US);
Roland Frech, Ostfildern, DE;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method and associated system for evaluating a high-frequency signal (S) at a point of interest on a signal path. The high-frequency signal (S) at the point of interest on the signal path is calculated by applying an inverse transfer function (iG) for the signal path to an argument of a remote signal (S) measured at a remote pickup point on the signal path, wherein the point of interest and the remote pickup point are two distant points on the signal path, wherein the high-frequency signal (S) and the remote signal (S) are represented as a respective time domain variable, and wherein said calculating is performed by a time domain evaluation process that operates in test equipment for electrical devices. The calculated high-frequency signal (S) is transferred to an output device of the test equipment.