The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2014

Filed:

Jul. 28, 2006
Applicants:

Kenneth H. Gilbert, Knoxville, TN (US);

John Douglas Birdwell, Oak Ridge, TN (US);

Tse-wei Wang, Oak Ridge, TN (US);

Dale V. Stransberry, Knoxville, TN (US);

Inventors:

Kenneth H. Gilbert, Knoxville, TN (US);

John Douglas Birdwell, Oak Ridge, TN (US);

Tse-Wei Wang, Oak Ridge, TN (US);

Dale V. Stransberry, Knoxville, TN (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/48 (2006.01); C12Q 1/68 (2006.01);
U.S. Cl.
CPC ...
Abstract

Analysis of DNA is critical to many applications including identifying perpetrators of crimes based on genetic evidence left at crime scenes. An initial step to analyzing DNA data is detection, identification, and quantization of allele peaks in the DNA data. The invention provides a method and apparatus for accurately and expeditiously performing this initial step by sequentially checking unfitted peaks against various models including a default model, a hybrid peak model, a dual fit model and, in special situations, a narrow fit function and a saturated fit function.


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