The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2014

Filed:

Jul. 14, 2011
Applicants:

Meir Tzur, Haifa, IL;

Guy Rapaport, Haifa, IL;

Inventors:

Meir Tzur, Haifa, IL;

Guy Rapaport, Haifa, IL;

Assignee:

CSR Technology Inc., San Jose, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G03B 3/00 (2006.01); G03B 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system, method, and computer program product are provided for automatically progressively determining focus depth estimates for an imaging device from defocused images. After a depth-from-defocus (DFD) system generates sometimes-noisy estimates for focus depth and optionally a confidence level that the focus depth estimate is correct, embodiments of the present invention process a sequence of such input DFD measures to iteratively decrease the likelihood of focus depth ambiguity and to increase an overall focus depth estimate confidence level. Automatic focus systems for imaging devices may use the outputs of the embodiments to operate more quickly and accurately, either directly or in combination with other focus depth estimation methods, such as calculated sharpness measures. A depth map of a 3D scene may be estimated for creating a pair of images based on a single image.


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